Application of Dynamic Supply Current Monitoring to Testing Mixed-Signal Circuits
نویسندگان
چکیده
منابع مشابه
Dynamic Supply Current Testing of Analog Circuits Using Wavelet Transform
Dynamic supply current (IDD) analysis has emerged as an e ective way for defect oriented testing of analog circuits. In this paper, we propose using wavelet decomposition of IDD for fault detection in analog circuits. Wavelet transform has the property of resolving events in both time and frequency domain simultaneously unlike fourier expansion which localizes a signal in terms of frequency onl...
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ژورنال
عنوان ژورنال: VLSI Design
سال: 1997
ISSN: 1065-514X,1563-5171
DOI: 10.1155/1997/47423